Standard
High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures. / Mariager, Simon Oddsson; Schlepuetz, C. M.; Aagesen, Martin; Sørensen, Claus B.; Johnson, Erik; Willmott, P. R.; Feidenhans'l, Robert Krarup.
In:
Physica Status Solidi - A - Applications and Materials Science, Vol. 206, No. 8, Sp.Iss. Sl., 2009, p. 1771-1774.
Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Mariager, SO, Schlepuetz, CM, Aagesen, M, Sørensen, CB
, Johnson, E, Willmott, PR
& Feidenhans'l, RK 2009, '
High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures',
Physica Status Solidi - A - Applications and Materials Science, vol. 206, no. 8, Sp.Iss. Sl., pp. 1771-1774.
https://doi.org/10.1002/pssa.200881612APA
Mariager, S. O., Schlepuetz, C. M., Aagesen, M., Sørensen, C. B.
, Johnson, E., Willmott, P. R.
, & Feidenhans'l, R. K. (2009).
High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures.
Physica Status Solidi - A - Applications and Materials Science,
206(8, Sp.Iss. Sl.), 1771-1774.
https://doi.org/10.1002/pssa.200881612Vancouver
Mariager SO, Schlepuetz CM, Aagesen M, Sørensen CB
, Johnson E, Willmott PR et al.
High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures.
Physica Status Solidi - A - Applications and Materials Science. 2009;206(8, Sp.Iss. Sl.):1771-1774.
https://doi.org/10.1002/pssa.200881612Author
Mariager, Simon Oddsson ; Schlepuetz, C. M. ; Aagesen, Martin ; Sørensen, Claus B. ; Johnson, Erik ; Willmott, P. R. ; Feidenhans'l, Robert Krarup. / High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures. In: Physica Status Solidi - A - Applications and Materials Science. 2009 ; Vol. 206, No. 8, Sp.Iss. Sl. pp. 1771-1774.
Bibtex
@article{2c7f1580001a11df825d000ea68e967b,
title = "High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures",
abstract = "Udgivelsesdato: 22 June",
author = "Mariager, {Simon Oddsson} and Schlepuetz, {C. M.} and Martin Aagesen and S{\o}rensen, {Claus B.} and Erik Johnson and Willmott, {P. R.} and Feidenhans'l, {Robert Krarup}",
year = "2009",
doi = "10.1002/pssa.200881612",
language = "English",
volume = "206",
pages = "1771--1774",
journal = "Physica Status Solidi (A) Applications and Materials Science",
issn = "1862-6300",
publisher = "Wiley - V C H Verlag GmbH & Co. KGaA",
number = "8, Sp.Iss. Sl.",
}
RIS
TY - JOUR
T1 - High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures
AU - Mariager, Simon Oddsson
AU - Schlepuetz, C. M.
AU - Aagesen, Martin
AU - Sørensen, Claus B.
AU - Johnson, Erik
AU - Willmott, P. R.
AU - Feidenhans'l, Robert Krarup
PY - 2009
Y1 - 2009
N2 - Udgivelsesdato: 22 June
AB - Udgivelsesdato: 22 June
U2 - 10.1002/pssa.200881612
DO - 10.1002/pssa.200881612
M3 - Journal article
VL - 206
SP - 1771
EP - 1774
JO - Physica Status Solidi (A) Applications and Materials Science
JF - Physica Status Solidi (A) Applications and Materials Science
SN - 1862-6300
IS - 8, Sp.Iss. Sl.
ER -
