Robert Krarup Feidenhans'l

Robert Krarup Feidenhans'l

Professor, Visiting professor

ORCID: 0000-0002-7963-3649

Publication year:
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  1. 2014
  2. Published

    Using grating based X-ray contrast modalities for metrology

    Angel, J. A. B., Lauridsen, T., Feidenhans'l, Robert Krarup, Nielsen, M. S. & De Chiffre, L., 2 Jun 2014, Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia. euspen ed. Dubrovnik, Croatia, p. 157-160

    Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

ID: 5863