Using grating based X-ray contrast modalities for metrology

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


  • euspen

    Submitted manuscript, 408 KB, PDF document

Jais Andreas Breusch Angel, Torsten Lauridsen, Robert Krarup Feidenhans'l, Mikkel Schou Nielsen, Leonardo De Chiffre

Original languageEnglish
Title of host publicationProceedings of the 14th euspen International Conference : 02/06/14 → 06/06/14, Dubrovnik, Croatia
Place of PublicationDubrovnik, Croatia
Publication date2 Jun 2014
Publication statusPublished - 2 Jun 2014

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