X-ray tomography using the full complex index of refraction

Research output: Contribution to journalJournal articleResearchpeer-review

  • Mikkel Schou Nielsen
  • Torsten Lauridsen
  • M. Thomsen
  • Torben Haugaard Jensen
  • Martin Bech
  • L.B. Christensen
  • Olsen E. V.
  • Hviid M.
  • Feidenhans'l, Robert Krarup
  • F. Pfeiffer
We report on x-ray tomography using the full complex index of refraction recorded with a grating-based x-ray phase-contrast setup. Combining simultaneous absorption and phase-contrast information, the distribution of the full complex index of refraction is determined and depicted in a bivariate graph. A simple multivariable threshold segmentation can be applied offering higher accuracy than with a single-variable threshold segmentation as well as new possibilities for the partial volume analysis and edge detection. It is particularly beneficial for low-contrast systems. In this paper, this concept is demonstrated by experimental results
Original languageEnglish
JournalPhysics in Medicine and Biology
Volume57
Issue number19
Pages (from-to)5971-5979
Number of pages9
ISSN0031-9155
DOIs
Publication statusPublished - 11 Sep 2012

ID: 40737240