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Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk. / Müter, Dirk; Sørensen, Henning Osholm; Jha, Diwaker; Harti, Ralph Patrick; Dalby, Kim Nicole; Suhonen, H.; Feidenhans'l, Robert Krarup; Engstrøm, F.; Stipp, Susan Louise Svane.
In:
Applied Physics Letters, Vol. 105, 043108, 2014.
Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Müter, D, Sørensen, HO, Jha, D, Harti, RP, Dalby, KN, Suhonen, H
, Feidenhans'l, RK, Engstrøm, F & Stipp, SLS 2014, '
Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk',
Applied Physics Letters, vol. 105, 043108.
https://doi.org/10.1063/1.4891965APA
Müter, D., Sørensen, H. O., Jha, D., Harti, R. P., Dalby, K. N., Suhonen, H.
, Feidenhans'l, R. K., Engstrøm, F., & Stipp, S. L. S. (2014).
Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk.
Applied Physics Letters,
105, [043108].
https://doi.org/10.1063/1.4891965Vancouver
Müter D, Sørensen HO, Jha D, Harti RP, Dalby KN, Suhonen H et al.
Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk.
Applied Physics Letters. 2014;105. 043108.
https://doi.org/10.1063/1.4891965Author
Müter, Dirk ; Sørensen, Henning Osholm ; Jha, Diwaker ; Harti, Ralph Patrick ; Dalby, Kim Nicole ; Suhonen, H. ; Feidenhans'l, Robert Krarup ; Engstrøm, F. ; Stipp, Susan Louise Svane. / Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk. In: Applied Physics Letters. 2014 ; Vol. 105.
Bibtex
@article{ed379de4664f4f43b7e4a5a2d9699ac5,
title = "Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk",
author = "Dirk M{\"u}ter and S{\o}rensen, {Henning Osholm} and Diwaker Jha and Harti, {Ralph Patrick} and Dalby, {Kim Nicole} and H. Suhonen and Feidenhans'l, {Robert Krarup} and F. Engstr{\o}m and Stipp, {Susan Louise Svane}",
year = "2014",
doi = "10.1063/1.4891965",
language = "English",
volume = "105",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
}
RIS
TY - JOUR
T1 - Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk
AU - Müter, Dirk
AU - Sørensen, Henning Osholm
AU - Jha, Diwaker
AU - Harti, Ralph Patrick
AU - Dalby, Kim Nicole
AU - Suhonen, H.
AU - Feidenhans'l, Robert Krarup
AU - Engstrøm, F.
AU - Stipp, Susan Louise Svane
PY - 2014
Y1 - 2014
U2 - 10.1063/1.4891965
DO - 10.1063/1.4891965
M3 - Journal article
VL - 105
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
M1 - 043108
ER -
