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Detection of sub-pixel fractures in X-ray dark-field tomography. / Lauridsen, Torsten; Willner, Marian; Bech, Martin; Pfeiffer, Franz; Feidenhans'l, Robert.
In:
Applied Physics A: Materials Science & Processing, Vol. 121, No. 3, 02.11.2015, p. 1243-1250.
Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Lauridsen, T, Willner, M, Bech, M, Pfeiffer, F
& Feidenhans'l, R 2015, '
Detection of sub-pixel fractures in X-ray dark-field tomography',
Applied Physics A: Materials Science & Processing, vol. 121, no. 3, pp. 1243-1250.
https://doi.org/10.1007/s00339-015-9496-2APA
Lauridsen, T., Willner, M., Bech, M., Pfeiffer, F.
, & Feidenhans'l, R. (2015).
Detection of sub-pixel fractures in X-ray dark-field tomography.
Applied Physics A: Materials Science & Processing,
121(3), 1243-1250.
https://doi.org/10.1007/s00339-015-9496-2Vancouver
Lauridsen T, Willner M, Bech M, Pfeiffer F
, Feidenhans'l R.
Detection of sub-pixel fractures in X-ray dark-field tomography.
Applied Physics A: Materials Science & Processing. 2015 Nov 2;121(3):1243-1250.
https://doi.org/10.1007/s00339-015-9496-2Author
Lauridsen, Torsten ; Willner, Marian ; Bech, Martin ; Pfeiffer, Franz ; Feidenhans'l, Robert. / Detection of sub-pixel fractures in X-ray dark-field tomography. In: Applied Physics A: Materials Science & Processing. 2015 ; Vol. 121, No. 3. pp. 1243-1250.
Bibtex
@article{4e1601889f2c4db7a54344ed03a00556,
title = "Detection of sub-pixel fractures in X-ray dark-field tomography",
author = "Torsten Lauridsen and Marian Willner and Martin Bech and Franz Pfeiffer and Robert Feidenhans'l",
year = "2015",
month = nov,
day = "2",
doi = "10.1007/s00339-015-9496-2",
language = "English",
volume = "121",
pages = "1243--1250",
journal = "Applied Physics A: Materials Science & Processing",
issn = "0947-8396",
publisher = "Springer",
number = "3",
}
RIS
TY - JOUR
T1 - Detection of sub-pixel fractures in X-ray dark-field tomography
AU - Lauridsen, Torsten
AU - Willner, Marian
AU - Bech, Martin
AU - Pfeiffer, Franz
AU - Feidenhans'l, Robert
PY - 2015/11/2
Y1 - 2015/11/2
U2 - 10.1007/s00339-015-9496-2
DO - 10.1007/s00339-015-9496-2
M3 - Journal article
VL - 121
SP - 1243
EP - 1250
JO - Applied Physics A: Materials Science & Processing
JF - Applied Physics A: Materials Science & Processing
SN - 0947-8396
IS - 3
ER -
