Standard
Universality of scanning tunneling microscopy in cuprate superconductors. / Choubey, Peayush; Kreisel, Andreas; Berlijn, T.; Andersen, Brian M.; Hirschfeld, P. J.
I:
Physical Review B, Bind 96, Nr. 17, 174523, 28.11.2017.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Choubey, P
, Kreisel, A, Berlijn, T
, Andersen, BM & Hirschfeld, PJ 2017, '
Universality of scanning tunneling microscopy in cuprate superconductors',
Physical Review B, bind 96, nr. 17, 174523.
https://doi.org/10.1103/PhysRevB.96.174523APA
Choubey, P.
, Kreisel, A., Berlijn, T.
, Andersen, B. M., & Hirschfeld, P. J. (2017).
Universality of scanning tunneling microscopy in cuprate superconductors.
Physical Review B,
96(17), [174523].
https://doi.org/10.1103/PhysRevB.96.174523Vancouver
Choubey P
, Kreisel A, Berlijn T
, Andersen BM, Hirschfeld PJ.
Universality of scanning tunneling microscopy in cuprate superconductors.
Physical Review B. 2017 nov. 28;96(17). 174523.
https://doi.org/10.1103/PhysRevB.96.174523Author
Choubey, Peayush ; Kreisel, Andreas ; Berlijn, T. ; Andersen, Brian M. ; Hirschfeld, P. J. / Universality of scanning tunneling microscopy in cuprate superconductors. I: Physical Review B. 2017 ; Bind 96, Nr. 17.
Bibtex
@article{8324b189b2d24a43ac0a46075ae3a32d,
title = "Universality of scanning tunneling microscopy in cuprate superconductors",
author = "Peayush Choubey and Andreas Kreisel and T. Berlijn and Andersen, {Brian M.} and Hirschfeld, {P. J.}",
year = "2017",
month = nov,
day = "28",
doi = "10.1103/PhysRevB.96.174523",
language = "English",
volume = "96",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
number = "17",
}
RIS
TY - JOUR
T1 - Universality of scanning tunneling microscopy in cuprate superconductors
AU - Choubey, Peayush
AU - Kreisel, Andreas
AU - Berlijn, T.
AU - Andersen, Brian M.
AU - Hirschfeld, P. J.
PY - 2017/11/28
Y1 - 2017/11/28
U2 - 10.1103/PhysRevB.96.174523
DO - 10.1103/PhysRevB.96.174523
M3 - Journal article
VL - 96
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
IS - 17
M1 - 174523
ER -
