Imaging electromigration during the formation of break junctions.

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  • Nl062631i

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Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
OriginalsprogEngelsk
TidsskriftNano Letters
Vol/bind7
Udgave nummer3
Sider (fra-til)652-656
Antal sider5
ISSN1530-6984
DOI
StatusUdgivet - 1 jan. 2007
Eksternt udgivetJa

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