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High-resolution three-dimensional reciprocal-space mapping of InAs nanowires. / Mariager, Simon Oddsson; Lauridsen, S. L.; Dohn, A.; Bovet, N.; Sørensen, C. B.; Schlepuetz, C. M.; Willmott, P. R.; Feidenhans'l, Robert Krarup.
I:
Journal of Applied Crystallography, Bind 42, Nr. part 3, 2009, s. 369-375.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Mariager, SO, Lauridsen, SL, Dohn, A, Bovet, N, Sørensen, CB, Schlepuetz, CM, Willmott, PR
& Feidenhans'l, RK 2009, '
High-resolution three-dimensional reciprocal-space mapping of InAs nanowires',
Journal of Applied Crystallography, bind 42, nr. part 3, s. 369-375.
https://doi.org/10.1107/S0021889809009145APA
Mariager, S. O., Lauridsen, S. L., Dohn, A., Bovet, N., Sørensen, C. B., Schlepuetz, C. M., Willmott, P. R.
, & Feidenhans'l, R. K. (2009).
High-resolution three-dimensional reciprocal-space mapping of InAs nanowires.
Journal of Applied Crystallography,
42(part 3), 369-375.
https://doi.org/10.1107/S0021889809009145Vancouver
Mariager SO, Lauridsen SL, Dohn A, Bovet N, Sørensen CB, Schlepuetz CM o.a.
High-resolution three-dimensional reciprocal-space mapping of InAs nanowires.
Journal of Applied Crystallography. 2009;42(part 3):369-375.
https://doi.org/10.1107/S0021889809009145Author
Mariager, Simon Oddsson ; Lauridsen, S. L. ; Dohn, A. ; Bovet, N. ; Sørensen, C. B. ; Schlepuetz, C. M. ; Willmott, P. R. ; Feidenhans'l, Robert Krarup. / High-resolution three-dimensional reciprocal-space mapping of InAs nanowires. I: Journal of Applied Crystallography. 2009 ; Bind 42, Nr. part 3. s. 369-375.
Bibtex
@article{7cc88760002911df825d000ea68e967b,
title = "High-resolution three-dimensional reciprocal-space mapping of InAs nanowires",
author = "Mariager, {Simon Oddsson} and Lauridsen, {S. L.} and A. Dohn and N. Bovet and S{\o}rensen, {C. B.} and Schlepuetz, {C. M.} and Willmott, {P. R.} and Feidenhans'l, {Robert Krarup}",
year = "2009",
doi = "10.1107/S0021889809009145",
language = "English",
volume = "42",
pages = "369--375",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "Wiley-Blackwell",
number = "part 3",
}
RIS
TY - JOUR
T1 - High-resolution three-dimensional reciprocal-space mapping of InAs nanowires
AU - Mariager, Simon Oddsson
AU - Lauridsen, S. L.
AU - Dohn, A.
AU - Bovet, N.
AU - Sørensen, C. B.
AU - Schlepuetz, C. M.
AU - Willmott, P. R.
AU - Feidenhans'l, Robert Krarup
PY - 2009
Y1 - 2009
U2 - 10.1107/S0021889809009145
DO - 10.1107/S0021889809009145
M3 - Journal article
VL - 42
SP - 369
EP - 375
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
SN - 0021-8898
IS - part 3
ER -
