Directional x-ray dark-field imaging of strongly ordered systems
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Standard
Directional x-ray dark-field imaging of strongly ordered systems. / Jensen....[et al.), Torben Haugaard; Bech, Martin; Feidenhans'l, Robert Krarup.
I: Physical Review B, Bind 82, Nr. 21, 06.12.2010, s. 214103.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Jensen....[et al.), TH, Bech, M & Feidenhans'l, RK 2010, 'Directional x-ray dark-field imaging of strongly ordered systems', Physical Review B, bind 82, nr. 21, s. 214103. https://doi.org/10.1103/PhysRevB.82.214103
APA
Jensen....[et al.), T. H., Bech, M., & Feidenhans'l, R. K. (2010). Directional x-ray dark-field imaging of strongly ordered systems. Physical Review B, 82(21), 214103. https://doi.org/10.1103/PhysRevB.82.214103
Vancouver
Jensen....[et al.) TH, Bech M, Feidenhans'l RK. Directional x-ray dark-field imaging of strongly ordered systems. Physical Review B. 2010 dec. 6;82(21):214103. https://doi.org/10.1103/PhysRevB.82.214103
Author
Bibtex
@article{0e6ac935ad094cceb6289e0c40f1e140,
title = "Directional x-ray dark-field imaging of strongly ordered systems",
author = "{Jensen....[et al.)}, {Torben Haugaard} and Martin Bech and Feidenhans'l, {Robert Krarup}",
year = "2010",
month = dec,
day = "6",
doi = "10.1103/PhysRevB.82.214103",
language = "English",
volume = "82",
pages = "214103",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
number = "21",
}
RIS
TY - JOUR
T1 - Directional x-ray dark-field imaging of strongly ordered systems
AU - Jensen....[et al.), Torben Haugaard
AU - Bech, Martin
AU - Feidenhans'l, Robert Krarup
PY - 2010/12/6
Y1 - 2010/12/6
U2 - 10.1103/PhysRevB.82.214103
DO - 10.1103/PhysRevB.82.214103
M3 - Journal article
VL - 82
SP - 214103
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
IS - 21
ER -
ID: 32961184