Towards scanning nanostructure X-ray microscopy

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

Standard

Towards scanning nanostructure X-ray microscopy. / Kovyakh, Anton; Banerjee, Soham; Liu, Chia-hao; Wright, Christopher J.; Li, Yuguang C.; Mallouk, Thomas E.; Feidenhans'l, Robert; Billinge, Simon J. L.

I: Journal of Applied Crystallography, Bind 56, Nr. 4, 01.08.2023, s. 1221-1228.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

Harvard

Kovyakh, A, Banerjee, S, Liu, C, Wright, CJ, Li, YC, Mallouk, TE, Feidenhans'l, R & Billinge, SJL 2023, 'Towards scanning nanostructure X-ray microscopy', Journal of Applied Crystallography, bind 56, nr. 4, s. 1221-1228. https://doi.org/10.1107/S1600576723005927

APA

Kovyakh, A., Banerjee, S., Liu, C., Wright, C. J., Li, Y. C., Mallouk, T. E., Feidenhans'l, R., & Billinge, S. J. L. (2023). Towards scanning nanostructure X-ray microscopy. Journal of Applied Crystallography, 56(4), 1221-1228. https://doi.org/10.1107/S1600576723005927

Vancouver

Kovyakh A, Banerjee S, Liu C, Wright CJ, Li YC, Mallouk TE o.a. Towards scanning nanostructure X-ray microscopy. Journal of Applied Crystallography. 2023 aug. 1;56(4):1221-1228. https://doi.org/10.1107/S1600576723005927

Author

Kovyakh, Anton ; Banerjee, Soham ; Liu, Chia-hao ; Wright, Christopher J. ; Li, Yuguang C. ; Mallouk, Thomas E. ; Feidenhans'l, Robert ; Billinge, Simon J. L. / Towards scanning nanostructure X-ray microscopy. I: Journal of Applied Crystallography. 2023 ; Bind 56, Nr. 4. s. 1221-1228.

Bibtex

@article{80fcd35fcd944985b41885c2c938e2a5,
title = "Towards scanning nanostructure X-ray microscopy",
author = "Anton Kovyakh and Soham Banerjee and Chia-hao Liu and Wright, {Christopher J.} and Li, {Yuguang C.} and Mallouk, {Thomas E.} and Robert Feidenhans'l and Billinge, {Simon J. L.}",
year = "2023",
month = aug,
day = "1",
doi = "10.1107/S1600576723005927",
language = "English",
volume = "56",
pages = "1221--1228",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "Wiley-Blackwell",
number = "4",

}

RIS

TY - JOUR

T1 - Towards scanning nanostructure X-ray microscopy

AU - Kovyakh, Anton

AU - Banerjee, Soham

AU - Liu, Chia-hao

AU - Wright, Christopher J.

AU - Li, Yuguang C.

AU - Mallouk, Thomas E.

AU - Feidenhans'l, Robert

AU - Billinge, Simon J. L.

PY - 2023/8/1

Y1 - 2023/8/1

U2 - 10.1107/S1600576723005927

DO - 10.1107/S1600576723005927

M3 - Journal article

C2 - 37555210

VL - 56

SP - 1221

EP - 1228

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

IS - 4

ER -

ID: 366342025