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Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask. / Bjorlig, Anders V.; von Soosten, Merlin; Erlandsen, Ricci; Dahm, Rasmus Tindal; Zhang, Yu; Gan, Yulin; Chen, Yunzhong; Pryds, Nini; Jespersen, Thomas S.
I:
Applied Physics Letters, Bind 112, Nr. 17, 171606, 23.04.2018.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Bjorlig, AV, von Soosten, M, Erlandsen, R, Dahm, RT, Zhang, Y, Gan, Y, Chen, Y, Pryds, N & Jespersen, TS 2018, '
Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask',
Applied Physics Letters, bind 112, nr. 17, 171606.
https://doi.org/10.1063/1.5026362APA
Bjorlig, A. V., von Soosten, M., Erlandsen, R., Dahm, R. T., Zhang, Y., Gan, Y., Chen, Y., Pryds, N., & Jespersen, T. S. (2018).
Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask.
Applied Physics Letters,
112(17), [171606].
https://doi.org/10.1063/1.5026362Vancouver
Bjorlig AV, von Soosten M, Erlandsen R, Dahm RT, Zhang Y, Gan Y o.a.
Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask.
Applied Physics Letters. 2018 apr. 23;112(17). 171606.
https://doi.org/10.1063/1.5026362Author
Bjorlig, Anders V. ; von Soosten, Merlin ; Erlandsen, Ricci ; Dahm, Rasmus Tindal ; Zhang, Yu ; Gan, Yulin ; Chen, Yunzhong ; Pryds, Nini ; Jespersen, Thomas S. / Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask. I: Applied Physics Letters. 2018 ; Bind 112, Nr. 17.
Bibtex
@article{3883a5255cc245ef97aee4fc9aca36dc,
title = "Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask",
author = "Bjorlig, {Anders V.} and {von Soosten}, Merlin and Ricci Erlandsen and Dahm, {Rasmus Tindal} and Yu Zhang and Yulin Gan and Yunzhong Chen and Nini Pryds and Jespersen, {Thomas S.}",
note = "[Qdev]",
year = "2018",
month = apr,
day = "23",
doi = "10.1063/1.5026362",
language = "English",
volume = "112",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "17",
}
RIS
TY - JOUR
T1 - Nanoscale patterning of electronic devices at the amorphous LaAlO3/SrTiO3 oxide interface using an electron sensitive polymer mask
AU - Bjorlig, Anders V.
AU - von Soosten, Merlin
AU - Erlandsen, Ricci
AU - Dahm, Rasmus Tindal
AU - Zhang, Yu
AU - Gan, Yulin
AU - Chen, Yunzhong
AU - Pryds, Nini
AU - Jespersen, Thomas S.
N1 - [Qdev]
PY - 2018/4/23
Y1 - 2018/4/23
U2 - 10.1063/1.5026362
DO - 10.1063/1.5026362
M3 - Journal article
VL - 112
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 17
M1 - 171606
ER -
