Using grating based X-ray contrast modalities for metrology

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Standard

Using grating based X-ray contrast modalities for metrology. / Angel, Jais Andreas Breusch; Lauridsen, Torsten; Feidenhans'l, Robert Krarup; Nielsen, Mikkel Schou; De Chiffre, Leonardo.

Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia. euspen. ed. Dubrovnik, Croatia, 2014. p. 157-160.

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Harvard

Angel, JAB, Lauridsen, T, Feidenhans'l, RK, Nielsen, MS & De Chiffre, L 2014, Using grating based X-ray contrast modalities for metrology. in Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia. euspen edn, Dubrovnik, Croatia, pp. 157-160.

APA

Angel, J. A. B., Lauridsen, T., Feidenhans'l, R. K., Nielsen, M. S., & De Chiffre, L. (2014). Using grating based X-ray contrast modalities for metrology. In Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia (euspen ed., pp. 157-160). Dubrovnik, Croatia.

Vancouver

Angel JAB, Lauridsen T, Feidenhans'l RK, Nielsen MS, De Chiffre L. Using grating based X-ray contrast modalities for metrology. In Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia. euspen ed. Dubrovnik, Croatia. 2014. p. 157-160

Author

Angel, Jais Andreas Breusch ; Lauridsen, Torsten ; Feidenhans'l, Robert Krarup ; Nielsen, Mikkel Schou ; De Chiffre, Leonardo. / Using grating based X-ray contrast modalities for metrology. Proceedings of the 14th euspen International Conference: 02/06/14 → 06/06/14, Dubrovnik, Croatia. euspen. ed. Dubrovnik, Croatia, 2014. pp. 157-160

Bibtex

@inproceedings{6ba06264b12e4f2f95b0de06de20b350,
title = "Using grating based X-ray contrast modalities for metrology",
author = "Angel, {Jais Andreas Breusch} and Torsten Lauridsen and Feidenhans'l, {Robert Krarup} and Nielsen, {Mikkel Schou} and {De Chiffre}, Leonardo",
year = "2014",
month = "6",
day = "2",
language = "English",
pages = "157--160",
booktitle = "Proceedings of the 14th euspen International Conference",
edition = "euspen",

}

RIS

TY - GEN

T1 - Using grating based X-ray contrast modalities for metrology

AU - Angel, Jais Andreas Breusch

AU - Lauridsen, Torsten

AU - Feidenhans'l, Robert Krarup

AU - Nielsen, Mikkel Schou

AU - De Chiffre, Leonardo

PY - 2014/6/2

Y1 - 2014/6/2

M3 - Article in proceedings

SP - 157

EP - 160

BT - Proceedings of the 14th euspen International Conference

CY - Dubrovnik, Croatia

ER -

ID: 127343345