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Using grating based X-ray contrast modalities for metrology

Research output: Research - peer-reviewArticle in proceedings

Documents

  • euspen

    Submitted manuscript, 407 KB, PDF-document

Jais Andreas Breusch Angel, Torsten Lauridsen, Robert Krarup Feidenhans'l, Mikkel Schou Nielsen, Leonardo De Chiffre

Original languageEnglish
Title of host publicationProceedings of the 14th euspen International Conference : 02/06/14 → 06/06/14, Dubrovnik, Croatia
Place of PublicationDubrovnik, Croatia
Publication date2 Jun 2014
Editioneuspen
Pages157-160
StatePublished - 2 Jun 2014

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