Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires
Research output: Contribution to journal › Journal article › Research › peer-review
| Original language | English |
|---|---|
| Article number | 165433 |
| Journal | Physical Review B |
| Volume | 96 |
| Issue number | 16 |
| Number of pages | 7 |
| ISSN | 2469-9950 |
| DOIs | |
| Publication status | Published - 19 Oct 2017 |
Bibliographical note
[Qdev]
ID: 185228649