Measurement of strain in the InGaN/GaN heterogeneous nanostructures

Research output: Contribution to journal › Journal article › Research › peer-review

  • Tomas Stankevic
  • S. Mickevicius
  • Mikkel Schou Nielsen
  • Feidenhans'l, Robert Krarup
  • Olga Kryliouk
  • Rafal Ciechonski
  • Giuliano Vescovi
  • Z. Bi
  • Anders Mikkelsen
  • Lars Samuelsen
  • Carsten Gundlach
Original languageEnglish
JournalJournal of Applied Crystallography
Volume48
Issue numberPart 2
Pages (from-to)344-349
Number of pages6
ISSN0021-8898
DOIs
Publication statusPublished - 12 Nov 2015

ID: 148104957