Resolution of Reflection Seismic Data Revisited

Publikation: KonferencebidragPaperForskningfagfællebedømt

Standard

Resolution of Reflection Seismic Data Revisited. / Hansen, Thomas Mejer; Mosegaard, Klaus; Zunino, Andrea.

2015. Paper præsenteret ved Petroleum Geostatistics 2015, Biarritz, Frankrig.

Publikation: KonferencebidragPaperForskningfagfællebedømt

Harvard

Hansen, TM, Mosegaard, K & Zunino, A 2015, 'Resolution of Reflection Seismic Data Revisited', Paper fremlagt ved Petroleum Geostatistics 2015, Biarritz, Frankrig, 07/09/2015 - 11/09/2015. https://doi.org/10.3997/2214-4609.201413595

APA

Hansen, T. M., Mosegaard, K., & Zunino, A. (2015). Resolution of Reflection Seismic Data Revisited. Paper præsenteret ved Petroleum Geostatistics 2015, Biarritz, Frankrig. https://doi.org/10.3997/2214-4609.201413595

Vancouver

Hansen TM, Mosegaard K, Zunino A. Resolution of Reflection Seismic Data Revisited. 2015. Paper præsenteret ved Petroleum Geostatistics 2015, Biarritz, Frankrig. https://doi.org/10.3997/2214-4609.201413595

Author

Hansen, Thomas Mejer ; Mosegaard, Klaus ; Zunino, Andrea. / Resolution of Reflection Seismic Data Revisited. Paper præsenteret ved Petroleum Geostatistics 2015, Biarritz, Frankrig.4 s.

Bibtex

@conference{9d3c546ba8c942f08e66e32d1f685692,
title = "Resolution of Reflection Seismic Data Revisited",
abstract = "The Rayleigh Principle states that the minimum separation between two reflectors that allows them to be visually separated is the separation where the wavelet maxima from the two superimposed reflections combine into one maximum. This happens around Δtres = λb/8, where λb is the predominant wavelength of the wavelet within the thin layer. Using a simple thin-layer parameterization Widess (1973) demonstrated that thin layers with thickness less that around λb/8 cannot be resolved from seismic data independent of the noise level. This has results since been widely adopted as a commonly accepted lower vertical resolution of reflection seismic data. In the following we will revisit think layer model and demonstrate that there is in practice no limit to the vertical resolution using the parameterization of Widess (1973), and that the vertical resolution is limited by the noise in the data. In general, we discuss that the resolution of reflection seismic data is controlled by the noise level and the a priori information available",
author = "Hansen, {Thomas Mejer} and Klaus Mosegaard and Andrea Zunino",
year = "2015",
month = sep,
day = "7",
doi = "10.3997/2214-4609.201413595",
language = "English",
note = "null ; Conference date: 07-09-2015 Through 11-09-2015",
url = "http://www.eage.org/event/index.php?eventid=1155",

}

RIS

TY - CONF

T1 - Resolution of Reflection Seismic Data Revisited

AU - Hansen, Thomas Mejer

AU - Mosegaard, Klaus

AU - Zunino, Andrea

PY - 2015/9/7

Y1 - 2015/9/7

N2 - The Rayleigh Principle states that the minimum separation between two reflectors that allows them to be visually separated is the separation where the wavelet maxima from the two superimposed reflections combine into one maximum. This happens around Δtres = λb/8, where λb is the predominant wavelength of the wavelet within the thin layer. Using a simple thin-layer parameterization Widess (1973) demonstrated that thin layers with thickness less that around λb/8 cannot be resolved from seismic data independent of the noise level. This has results since been widely adopted as a commonly accepted lower vertical resolution of reflection seismic data. In the following we will revisit think layer model and demonstrate that there is in practice no limit to the vertical resolution using the parameterization of Widess (1973), and that the vertical resolution is limited by the noise in the data. In general, we discuss that the resolution of reflection seismic data is controlled by the noise level and the a priori information available

AB - The Rayleigh Principle states that the minimum separation between two reflectors that allows them to be visually separated is the separation where the wavelet maxima from the two superimposed reflections combine into one maximum. This happens around Δtres = λb/8, where λb is the predominant wavelength of the wavelet within the thin layer. Using a simple thin-layer parameterization Widess (1973) demonstrated that thin layers with thickness less that around λb/8 cannot be resolved from seismic data independent of the noise level. This has results since been widely adopted as a commonly accepted lower vertical resolution of reflection seismic data. In the following we will revisit think layer model and demonstrate that there is in practice no limit to the vertical resolution using the parameterization of Widess (1973), and that the vertical resolution is limited by the noise in the data. In general, we discuss that the resolution of reflection seismic data is controlled by the noise level and the a priori information available

U2 - 10.3997/2214-4609.201413595

DO - 10.3997/2214-4609.201413595

M3 - Paper

Y2 - 7 September 2015 through 11 September 2015

ER -

ID: 156558853